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Philip Nakashima

Philip Nakashima

Associate Professor, Materials Science and Engineering & ARC Future Fellow
Philip.Nakashima@monash.edu
Phone:
+61 3 990 59981
Homepage:
http://www.philipnakashima.com
Office:
Room 356, 20 Research, Clayton Campus
Qualification:
Ph.D. (Physics), B.E. (Hons, Materials Engineering), B.Sc. (Hons, Chemical Physics)
Description/Interests:
Override Quantitative Electron Diffraction, Crystallography, Charge Density

Philip's research focusses on measuring atomic and electronic structure in materials by electron diffraction. He obtained first class honours in Physics and Materials Engineering from the University of Western Australia and in 2003, received his PhD with distinction in Physics from the same university. His research interests include electron scattering theory, transmission electron microscopy, electron diffraction, quantitative image processing and analysis, accurate structure determination, accurate electron density and chemical bonding measurements, and metals physics.

Professional Awards:

2012: THE JOHN SANDERS MEDAL: For excellence in developing or applying electron microscope techniques, with particular attention to problems of practical importance in the physical and chemical sciences. Awarded biennially by the Australian Microscopy and Microanalysis Society Inc.
2011: AUSTRALIAN RESEARCH COUNCIL FUTURE FELLOWSHIP: Interatomic bonding in (aluminium) alloys
2011: THE BARRY INGLIS MEDAL: For outstanding achievement in measurement research by an individual (or group) in the fields of academia, research or industry in Australia. Awarded by the National Measurement Institute and announced by Senator the Hon. Kim Carr, Minister for Innovation, Industry, Science and Research.
2006: THE COWLEY-MOODIE AWARD: For research excellence using electron microscopy in the physical sciences. Awarded biennially by the Australian Microscopy and Microanalysis Society

Teaching Commitments:

  • MTE4598
  • MTE3547
  • MTE5881
  • MTE6881

Publications:

  • P.N.H. Nakashima, JOURNAL OF APPLIED CRYSTALLOGRAPHY 38 (2005), 374.
  • V.A. Streltsov, P.N.H. Nakashima, A.N. Sobolev, R.P. Ozerov, ACTA CRYSTALLOGRAPHICA B 61 (2005), 17.
  • P.N.H. Nakashima, A.W.S. Johnson, ULTRAMICROSCOPY 94 (2003), 135.
  • V.A. Streltsov, P.N.H. Nakashima, A.W.S. Johnson, MICROSCOPY AND MICROANALYSIS 9 (2003), 419.
  • V.A. Streltsov, P.N.H. Nakashima, A.W.S. Johnson, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS 62 (2001), 2109.
  • P.N.H. Nakashima, T. Tsuzuki, A.W.S. Johnson, JOURNAL OF APPLIED PHYSICS 85 (1999), 1556.
  • P.N.H. Nakashima, B.C. Muddle, PHYSICAL REVIEW B 81 (2010), 115135.
  • P.N.H. Nakashima, A.F. Moodie, J. Etheridge, PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE USA 110 (2013), 14144.
  • P.N.H. Nakashima, OPTICS LETTERS 37 (2012), 1023.
  • P.N.H. Nakashima, AUST. PHYS. 49(1) (2012), 19.
  • R. Bjorge, C. Dwyer, M. Weyland, P.N.H. Nakashima, C.D. Marioara, S.J. Andersen, J. Etheridge, R. Holmestad, ACTA MATERIALIA 60 (2012), 3239.
  • P.N.H. Nakashima, A.F. Moodie, J. Etheridge, ULTRAMICROSCOPY 111 (2011), 841.
  • P.N.H. Nakashima, A.E. Smith, J. Etheridge, B.C. Muddle, SCIENCE 331 (2011), 1583.
  • A.C.Y. Liu, D.M. Paganin, L. Bourgeois, P.N.H. Nakashima, R.T. Ott, M.J. Kramer, PHYSICAL REVIEW B 84 (2011), 094201.
  • R. Bjorge, P.N.H. Nakashima, C.D. Marioara, S.J. Andersen, B.C. Muddle, J. Etheridge, R. Holmestad, ACTA MATERIALIA 59 (2011), 6103.
  • A.C.Y. Liu, D.M. Paganin, L. Bourgeois, P.N.H. Nakashima, ULTRAMICROSCOPY 111 (2011), 959.
  • P.N.H. Nakashima, B.C. Muddle, JOURNAL OF APPLIED CRYSTALLOGRAPHY 43 (2010), 280-284.
  • R.P. Erni, M.D. Rossell, P.N.H. Nakashima, ULTRAMICROSCOPY 110 (2010),151.
  • Y. Huang, J. Ho, Z. Wang, P. Nakashima, A.J. Hill, H. Wang, MICROPOROUS AND MESOPOROUS MATERIALS 117 (2009), 490.
  • P.N.H. Nakashima, A.F. Moodie, J. Etheridge, ULTRAMICROSCOPY 108 (2008), 901.
  • P.N.H. Nakashima, PHYSICAL REVIEW LETTERS 99 (2007), 125506.
  • P.N.H. Nakashima, A.F. Moodie, J. Etheridge, ACTA CRYSTALLOGRAPHICA A 63 (2007), 387.
  • M.V. Kral, P.N.H. Nakashima, D.R.G. Mitchell, METALLURGICAL AND MATERIALS TRANSACTIONS A 37 (2006), 1987.

Professional Association:

Australian Microscopy and Microanalysis Society
Society of Crystallographers for Australia and New Zealand, International Union of Crystallography
American Association for the Advancement of Science

Research Interests:

  • Convergent beam electron diffraction
  • Transmission electron microscopy
  • Detector characterisation
  • Chemical bonding and charge density studies
  • Crystallography
  • Metals physics
  • Atomic structure solution
  • Image processing